hw-testinglisted

# Hardware Testing Capability Pack > From power-on to production validation — physical measurement + AI-guided analysis. > **Scope (v0.1, inherited from source v1.0)**: Embedded hardware prototypes (MCU-based, battery-powered devices). Hardware testing requires PHYSICAL instruments (multimeter, oscilloscope, power analyzer) — this pack's value is what to test + how to test + pass/fail criteria + documentation. > **UNIVERSAL RULE**: 编造数据 = FAIL. Every voltage, current, RSSI, timing, or sensor value must come from an actual instrument reading (human-reported for pair testing). Fabricated measurements, standard citations, or harmonic numbers = FAIL. Measure it or report "not measured". --- ## Step 1: Context Detection | User Signal / Task Type | Load Reference | |---|---| | new board bring-up, first power-on, voltage rails, smoke test, 上电, 冒烟测试, 电源轨 | `references/power-on-test.md` | | peripheral verification, display/sensor/button/WiFi/BLE/SD test, I2C scan, 外设, 功能测�� | `references/functional-test.md` | | power profiling, sleep current, battery life, µA, 功耗, 续航, 深度睡眠 | `references/power-measurement.md` | | temperature/humidity/drop/vibration test plan, IP rating, IEC 60068, MIL-STD, 环境测试 | `references/environmental-test.md` | | EMC, radiated/conducted emissions, ESD, FCC/CE/CCC, harmonics, 电磁兼容, 预检 | `references/emc-precheck.md` | | production test, bed-of-nails, pogo pin, jig, cycle time, 治具, 量产 | `references/test-fixture.md` | | human at the bench with instruments, guided