afm-spm-analyzer

# AFM-SPM Analyzer ## Purpose The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements. ## Capabilities - Topography imaging and analysis - Surface roughness calculation (Ra, RMS) - Force-distance curve analysis - Nanoindentation and mechanical mapping - Kelvin probe force microscopy (KPFM) - Conductive AFM measurements ## Usage Guidelines ### AFM Analysis Workflow 1. **Topography Analysis** - Apply plane leveling corrections - Remove artifacts and noise - Calculate roughness parameters 2. **Mechanical Mapping** - Calibrate cantilever spring constant - Apply contact mechanics models - Generate modulus maps 3. **Electrical Measurements** - Calibrate work function reference - Map surface potential - Measure local conductivity ## Process Integration - Multi-Modal Nanomaterial Characterization Pipeline - In-Situ Characterization Experiment Design - Thin Film Deposition Process Optimization ## Input Schema ```json { "data_file": "string", "analysis_type": "topography|force_curves|mechanical|electrical", "cantilever_specs": { "spring_constant": "number (N/m)", "tip_radius": "number (nm)" } } ``` ## Output Schema ```json { "topography": { "Ra": "number (nm)", "RMS": "number (nm)", "Rmax": "number (nm)", "image_path": "string" }, "mechanical": {...