sem-eds-analyzer

# SEM-EDS Analyzer ## Purpose The SEM-EDS Analyzer skill provides comprehensive scanning electron microscopy and energy dispersive X-ray spectroscopy analysis for nanomaterial morphology and elemental composition characterization. ## Capabilities - Automated SEM image analysis - EDS spectrum acquisition and quantification - Elemental mapping and line scans - Particle size from SEM images - Surface morphology characterization - Cross-section analysis ## Usage Guidelines ### SEM-EDS Analysis 1. **Image Acquisition** - Optimize accelerating voltage for sample - Select appropriate detector (SE, BSE) - Minimize charging artifacts 2. **EDS Analysis** - Acquire spectra at appropriate kV - Apply ZAF corrections - Generate elemental maps 3. **Quantification** - Use standardless or standards-based - Report detection limits - Account for matrix effects ## Process Integration - Multi-Modal Nanomaterial Characterization Pipeline - Nanodevice Integration Process Flow - Nanolithography Process Development ## Input Schema ```json { "sample_id": "string", "analysis_type": "imaging|eds_point|eds_map|line_scan", "accelerating_voltage": "number (kV)", "elements_of_interest": ["string"] } ``` ## Output Schema ```json { "morphology": { "features": ["string"], "measurements": [{"feature": "string", "value": "number", "unit": "string"}] }, "composition": [{ "element": "string", "weight_percent": "number", "atomic_percent": "...